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 74ACQ373 * 74ACTQ373 Quiet Series Octal Transparent Latch with 3-STATE Outputs
July 1989 Revised November 1999
74ACQ373 * 74ACTQ373 Quiet Series Octal Transparent Latch with 3-STATE Outputs
General Description
The ACQ/ACTQ373 consists of eight latches with 3-STATE outputs for bus organized system applications. The latches appear transparent to the data when Latch Enable (LE) is HIGH. When LE is LOW, the data satisfying the input timing requirements is latched. Data appears on the bus when the Output Enable (OE) is LOW. When OE is HIGH, the bus output is in the HIGH impedance state. The ACQ/ACTQ373 utilizes Fairchild Quiet Series technology to guarantee quiet output switching and improve dynamic threshold performance. features GTO output control and undershoot corrector in addition to a split ground bus for superior performance.
Features
s ICC and IOZ reduced by 50% s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Improved latch up immunity s Eight latches in a single package s 3-STATE outputs drive bus lines or buffer memory address registers s Outputs source/sink 24 mA s Faster prop delays than the standard AC/ACT373
Ordering Code:
Order Number 74ACQ373SC 74ACQ373SJ 74ACQ373PC 74ACTQ373SC 74ACTQ373SJ 74ACQT373QSC 74ACTQ373PC Package Number M20B M20D N20A M20B M20D MQA20 N20A Package Description 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Body 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001m 0.300" Wide 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Body 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001m 0.300" Wide
Device also available in Tape and Reel. Specify by appending suffix letter "X" to the ordering code.
Connection Diagram
Pin Descriptions
Pin Names D0-D7 LE OE O0-O7 Description Data Inputs Latch Enable Input Output Enable Input 3-STATE Latch Outputs
FACT, Quiet Series, FACT Quiet Series, and GTO are trademarks of Fairchild Semiconductor Corporation.
(c) 1999 Fairchild Semiconductor Corporation
DS010237
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74ACQ373 * 74ACTQ373
Logic Symbols
Functional Description
The ACQ/ACTQ373 contains eight D-type latches with 3STATE standard outputs. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW, the latches store the information that was present on the D inputs at setup time preceding the HIGHto-LOW transition of LE. The 3-STATE standard outputs are controlled by the Output Enable (OE) input. When OE is LOW, the standard outputs are in the 2-state mode. When OE is HIGH, the standard outputs are in the high impedance mode but this does not interfere with entering new data into the latches.
IEEE/IEC
Truth Table
Inputs LE X H H L OE H L L L Dn X L H X Outputs On Z L H O0
H = HIGH Voltage Level L = LOW Voltage Level Z = High Impedance X = Immaterial O0 = Previous O0 before HIGH-to-LOW transition of Latch Enable
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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74ACQ373 * 74ACTQ373
Absolute Maximum Ratings(Note 1)
Supply Voltage (VCC) DC Input Diode Current (IIK) VI = -0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = -0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latchup Source or Sink Current Junction Temperature (TJ) PDIP 140C 300 mA 50 mA -65C to +150C 50 mA -20 mA +20 mA -0.5V to VCC + 0.5V -20 mA +20 mA -0.5V to VCC + 0.5V -0.5V to +7.0V
Recommended Operating Conditions
Supply Voltage (VCC) ACQ ACTQ Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate V/t ACQ Devices VIN from 30% to 70% of VCC VCC @ 3.0V, 4.5V, 5.5V Minimum Input Edge Rate V/t ACTQ Devices VCC @ 4.5V, 5.5V 125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications.
2.0V to 6.0V 4.5V to 5.5V 0V to VCC 0V to VCC -40C to +85C
125 mV/ns
DC Electrical Characteristics for ACQ
Symbol VIH Parameter Minimum HIGH Level Input Voltage VIL Maximum LOW Level Input Voltage VOH Minimum HIGH Level Output Voltage V CC (V) 3.0 4.5 5.5 3.0 4.5 5.5 3.0 4.5 5.5 3.0 4.5 5.5 VOL Maximum LOW Level Output Voltage 3.0 4.5 5.5 3.0 4.5 5.5 IIN (Note 4) IOLD IOHD IOZ Maximum Input Leakage Current Minimum Dynamic Output Current (Note 3) Maximum 3-STATE Leakage Current VOLP VOLV Quiet Output Maximum Dynamic VOL Quiet Output Maximum Dynamic VOL 5.5 0.25 2.5 A 5.5 5.5 5.5 5.5 4.0 0.002 0.001 0.001 TA = +25C Typ 1.5 2.25 2.75 1.5 2.25 2.75 2.99 4.49 5.49 2.1 3.15 3.85 0.9 1.35 1.65 2.9 4.4 5.4 2.56 3.86 4.86 0.1 0.1 0.1 0.36 0.36 0.36 0.1 TA = -40C to +85C Guaranteed Limits 2.1 3.15 3.85 0.9 1.35 1.65 2.9 4.4 5.4 VIN = VIL or VIH 2.46 3.76 4.76 0.1 0.1 0.1 VIN = VIL or VIH 0.44 0.44 0.44 1.0 75 -75 40.0 A mA mA A V IOL = 12 mA IOL = 24 mA IOL = 24 mA (Note 2) VI = VCC, GND VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND 5.0 5.0 1.1 -0.6 1.5 -1.2 V V Figure 1, Figure 2 (Note 5)(Note 6) Figure 2, Figure 2 (Note 5)(Note 6) V IOUT = 50 A V IOH = -12 mA IOH = -24 mA IOH = -24 mA (Note 2) V IOUT = -50 A V VOUT = 0.1V or VCC - 0.1V V Units Conditions VOUT = 0.1V or VCC - 0.1V
ICC (Note 4) Maximum Quiescent Supply Current
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74ACQ373 * 74ACTQ373
DC Electrical Characteristics for ACQ
Symbol VIHD VILD Parameter Minimum HIGH Level Dynamic Input Voltage Maximum LOW Level Dynamic Input Voltage VCC (V) 5.0 5.0
(Continued)
TA = +25C TA = -40C to +85C Guaranteed Limits 3.5 1.5 V V (Note 5)(Note 7) (Note 5)(Note 7)
Units
Conditions
Typ 3.1 1.9
Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. Note 5: DIP package. Note 6: Max number of outputs defined as (n). Data inputs are driven 0V to 5V. One output @ GND. Note 7: Max number of data inputs (n) switching. (n-1) inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Symbol VIH VIL VOH Parameter Minimum HIGH Level Input Voltage Maximum LOW Level Input Voltage Minimum HIGH Level Output Voltage VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 VOL Maximum LOW Level Output Voltage 4.5 5.5 4.5 5.5 IIN (Note 4) IOZ ICCT IOLD IOHD VOLP VOLV VIHD VILD Maximum Input Leakage Current Maximum 3-STATE Leakage Current Maximum ICC/Input Minimum Dynamic Output Current (Note 9) Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Minimum HIGH Level Dynamic Input Voltage Maximum LOW Level Dynamic Input Voltage 5.5 5.5 5.5 5.5 5.5 5.5 5.0 5.0 5.0 5.0 1.1 -0.6 1.9 1.2 4.0 1.5 -1.2 2.2 0.8 0.6 0.001 0.001 TA = +25C Typ 1.5 1.5 1.5 1.5 4.49 5.49 2.0 2.0 0.8 0.8 4.4 5.4 3.86 4.86 0.1 0.1 0.36 0.36 0.1 0.25 TA = -40C to +85C Guaranteed Limits 2.0 2.0 0.8 0.8 4.4 5.4 3.76 4.76 0.1 0.1 0.44 0.44 1.0 2.5 1.5 75 -75 40.0 A A mA mA mA A V V V V V Units V V V Conditions VOUT = 0.1V or VCC - 0.1V VOUT = 0.1V or VCC - 0.1V IOUT = -50 A VIN = VIL or VIH V IOH = -24 mA IOH = -24 mA (Note 8) IOUT = 50 A VIN = VIL or VIH V IOL = 24 mA IOL = 24 mA (Note 8) VI = VCC, GND VI = VIL, VIH VO = VCC, GND VI = VCC - 2.1V VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC, or GND Figure 1, Figure 2 (Note 10)(Note 11) Figure 1, Figure 2 (Note 10)(Note 11) (Note 10)(Note 12) (Note 10)(Note 12)
ICC (Note 4) Maximum Quiescent Supply Current
Note 8: All outputs loaded; thresholds on input associated with output under test. Note 9: Maximum test duration 2.0 ms, one output loaded at a time. Note 10: Plastic DIP package. Note 11: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 12: Max number of data inputs (n) switching. (n-1) inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
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74ACQ373 * 74ACTQ373
AC Electrical Characteristics for ACQ
VCC Symbol tPHL tPLH tPHL tPLH tPZL tPZH tPHZ tPLZ tOSHL tOSLH Output to Output Skew Dn to On(Note 14)
Voltage Range 3.3 is 3.3V 0.3V. Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.
TA = +25C CL = 50 pF Min 2.5 1.5 2.5 2.0 2.5 1.5 1.0 1.0 Typ 8.0 5.5 8.0 6.0 8.5 6.5 9.0 6.5 1.0 0.5 Max 10.5 7.0 12.0 8.0 13.0 8.5 14.5 9.5 1.5 1.0
TA = -40C to +85C CL = 50 pF Min 2.5 1.5 2.5 2.0 2.5 1.5 1.0 1.0 Max 11.0 7.5 12.5 8.5 13.5 9.0 15.0 10.0 1.5 1.0 ns ns ns ns ns Units
Parameter Propagation Delay Dn to On Propagation Delay LE to On Output Enable Time Output Disable Time
(V) (Note 13) 3.3 5.0 3.3 5.0 3.3 5.0 3.3 5.0 3.3 5.0
Note 13: Voltage Range 5.0 is 5.0V 0.5V.
AC Operating Requirements for ACQ
VCC Symbol Parameter (V) (Note 15) tS tH tW Setup Time, HIGH or LOW Dn to LE Hold Time, HIGH or LOW Dn to LE LE Pulse Width, HIGH 3.3 5.0 3.3 5.0 3.3 5.0
Note 15: Voltage Range 5.0 is 5.0V 0.5V. Voltage Range 3.3 is 3.3V 0.3V.
TA = +25C CL = 50 pF Typ 0 0 0 0 2.0 2.0 3.0 3.0 1.5 1.5 4.0 4.0
TA = -40C to +85C CL = 50 pF Guaranteed Minimum 3.0 3.0 1.5 1.5 4.0 4.0 ns ns ns Units
AC Electrical Characteristics for ACTQ
VCC Symbol tPHL tPLH tPHL tPLH tPZL tPZH tPHZ tPLZ tOSHL tOSLH Parameter Propagation Delay Dn to On Propagation Delay LE to On Output Enable Time Output Disable Time Output to Output Skew Dn to On(Note 17) (V) (Note 16) 5.0 5.0 5.0 5.0 5.0 Min 2.0 2.5 2.0 1.0 TA = +25C CL = 50 pF Typ 6.5 7.0 7.0 8.0 0.5 Max 7.5 8.5 9.0 10.0 1.0 TA = -40C to +85C CL = 50 pF Min 2.0 2.5 2.0 1.0 Max 8.0 9.0 9.5 10.5 1.0 ns ns ns ns ns Units
Note 16: Voltage Range 5.0 is 5.0V 0.5V. Note 17: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.
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74ACQ373 * 74ACTQ373
AC Operating Requirements for ACTQ
VCC Symbol tS tH tW Parameter Setup Time, HIGH or LOW Dn to LE Hold Time, HIGH or LOW Dn to LE LE Pulse Width, HIGH
Note 18: Voltage Range 5.0 is 5.0V 0.5V
TA = +25C CL = 50 pF Typ 0 0 2.0 3.0 1.5 4.0
TA = -40C to +85C CL = 50 pF Guaranteed Minimum 3.0 1.5 4.0 ns ns ns Units
(V) (Note 18) 5.0 5.0 5.0
Capacitance
Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 44.0 Units pF pF VCC = OPEN VCC = 5.0V Conditions
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74ACQ373 * 74ACTQ373
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. VOLP/VOLV and VOHP/V OHV: * Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50 coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. * Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. * Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. VILD and VIHD: * Monitor one of the switching outputs using a 50 coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. * First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. * Next decrease the input HIGH voltage level, VIH until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD. * Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements.
Note A: VOHV and VOLP are measured with respect to ground reference. Note B: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
FIGURE 2. Simultaneous Switching Test Circuit
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74ACQ373 * 74ACTQ373
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Body Package Number M20B
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74ACQ373 * 74ACTQ373
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M20D
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74ACQ373 * 74ACTQ373 Quiet Series Octal Transparent Latch with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 10 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com


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